聚焦離子束 

FIB/SEM dual beam

透過電子顯微鏡

TEM, and related techniques

原子力顯微鏡

AFM, and other SPM techniques

掃描電子顯微鏡

Scanning Electron Microscope (SEM)

能量色散X射線譜

SEM-EDS

電子背散射繞射

SEM-EBSD

三維原子探針

Atom Probe Tomography (APT)

三次元坐標儀

Coordinate Measuring Machine (CMM)

電感耦合電漿質譜儀

ICP-MS

橢偏儀

Spectroscopic Ellipsometer

有限元分析

Finite Element Analysis (FEA)

3D建模與作圖

3D Modeling and Rendering

Please ask!